BERNARD A. | Ecole Centrale de Nantes, France |
BOER C. | ICIMSI-SUPSI, Switzerland |
BYRNE G. | University College Dublin, Ireland |
CARPANZANO E. | ITIA-CNR, Italy |
CUNHA P. | Instituto Politecnico de Setubal, Portugal |
DENKENA B. | Leibniz, Universitaet Hannover, Germany |
DUFLOU J. | Katholieke Universiteit Leuven, Belgium |
DUMUR D. | Ecole Superieure d' Electricite, France |
FISCHER A. | TECHNION, Israel |
GALANTUCCI L. | Politecnico di Bari, Italy |
HUANG, G. Q. | University of Hong Kong |
INASAKI I. | Chubu University, Japan |
JOVANE F. | Politecnico di Milano, Italy |
KIMURA F. | Hosei University, Japan |
KJELLBERG T. | Royal Institute of Technology, Sweden |
KOREN Y. | University of Michigan, USA |
KUMARA S. | Pennsylvania State University, USA |
LEVY G. | Inspire AG, Switzerland |
MAROPOULOS P. | University of Bath |
MONOSTORI L. | Hungarian Academy of Sciences, Hungary |
NEE A. | National University of Singapore, Singapore |
ROY R. | Cranfield University, UK |
SANTOCHI M. | University of Pisa, Italy |
SCHOLZ-REITER B. | University of Bremen, Germany |
SCHOENSLEBEN P. | ETH Zurich, Switzerland |
SELIGER G. | Fraunhofer-Berlin, Germany |
SHPITALNI M. | TECHNION, Israel |
SUH P. N. | KAIST, Korea |
SUTHERLAND J. | Purdue University, USA |
TETI R. | University of Naples Federico II, Italy |
TICHKIEWITCH S. | Laboratoire G-SCOP, France |
TOLIO T. | ITIA-CNR, Italy |
TOMIYAMA T. | Delft University of Technology, Netherlands |
TSENG M. | Hong Kong University of Science and Technology, Hong Kong |
VAN BRUSSEL H. | Katholieke Universiteit Leuven, Belgium |
VAN HOUTEN F. | University of Twente, Netherlands |
WERTHEIM R. | Fraunhofer IWU, Germany |
WESTKAEMPER E. | University of Stuttgart, Germany |